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Paper Abstract and Keywords
Presentation 2026-09-25 13:05
A Single Exposure 137 dB Dynamic Range CMOS Image Sensor with Low Dielectric Absorption Image Lag
Eiichiro Kosugo, Takaya Yamanaka, Ken Yahata, Mitsuki Hayashida, Takuto Ohashi, Kei Matsumoto, Makoto Aoki, Haruyuki Yoshida, Keisuke Watanabe (SSS), Yasuo Kiyofuji, Satoshi Gondo (SCK), Yorito Sakano, Yusuke Oike (SSS)
Abstract (in Japanese) (See Japanese page) 
(in English) This paper presents a 2897×1877 CMOS image sensor with a 3.0 μm pixel pitch. The proposed sensor achieves a 137 dB single-exposure dynamic range (SEDR) at 85 °C and a 28 dB junction SNR at 105 °C. The sensor employs a sub-pixel architecture with 3D-MIM technology and includes a function to reduce the dielectric-absorption image lag. The combination of high dynamic range and reduced dielectric-absorption image lag makes the sensor well-suited for automotive applications.
Keyword (in Japanese) (See Japanese page) 
(in English) CMOS image sensor / dielectric absorption / image lag / High Dynamic Range / / / /  
Reference Info. ITE Tech. Rep., vol. 50, no. 28, IST2026-38, pp. 1-4, Sept. 2026.
Paper # IST2026-38 
Date of Issue 2026-09-18 (IST) 
ISSN Online edition: ISSN 2424-1970
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Conference Information
Committee IST  
Conference Date 2026-09-25 - 2026-09-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IST 
Conference Code 2026-09-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Single Exposure 137 dB Dynamic Range CMOS Image Sensor with Low Dielectric Absorption Image Lag 
Sub Title (in English)  
Keyword(1) CMOS image sensor  
Keyword(2) dielectric absorption  
Keyword(3) image lag  
Keyword(4) High Dynamic Range  
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1st Author's Name Eiichiro Kosugo  
1st Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
2nd Author's Name Takaya Yamanaka  
2nd Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
3rd Author's Name Ken Yahata  
3rd Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
4th Author's Name Mitsuki Hayashida  
4th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
5th Author's Name Takuto Ohashi  
5th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
6th Author's Name Kei Matsumoto  
6th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
7th Author's Name Makoto Aoki  
7th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
8th Author's Name Haruyuki Yoshida  
8th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
9th Author's Name Keisuke Watanabe  
9th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
10th Author's Name Yasuo Kiyofuji  
10th Author's Affiliation Sony Semiconductor Manufacturing Corporation (SCK)
11th Author's Name Satoshi Gondo  
11th Author's Affiliation Sony Semiconductor Manufacturing Corporation (SCK)
12th Author's Name Yorito Sakano  
12th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
13th Author's Name Yusuke Oike  
13th Author's Affiliation Sony Semiconductor Solutions Corporation (SSS)
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Speaker Author-1 
Date Time 2026-09-25 13:05:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2026-38 
Volume (vol) vol.50 
Number (no) no.28 
Page pp.1-4 
#Pages 4 
Date of Issue 2026-09-18 (IST) 

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