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Technical Group on Information Sensing Technologies (IST) [schedule] [select]

Technical Committee on Silicon Device and Materials (IEICE-SDM) [schedule] [select]
Chair Takahiro Shinada (Tohoku Univ.)
Vice Chair Hiroshige Hirano (TowerJazz Panasonic)
Secretary Hiroya Ikeda (Shizuoka Univ.), Tetsu Morooka (TOSHIBA MEMORY)
Assistant Takahiro Mori (AIST), Nobuaki Kobayashi (Nihon Univ.)

Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [schedule] [select]
Chair Makoto Nagata (Kobe Univ.)
Vice Chair Masafumi Takahashi (Toshiba-memory)
Secretary Masanori Natsui (Tohoku Univ.), Masatoshi Tsuge (Socionext)
Assistant Tetsuya Hirose (Osaka Univ.), Koji Nii (Floadia), Takeshi Kuboki (Kyushu Univ.)

Conference Date Wed, Aug 7, 2019 13:30 - 17:15
Thu, Aug 8, 2019 09:15 - 17:00
Fri, Aug 9, 2019 09:30 - 15:00
Topics Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Conference Place Hokkaido Univ., Graduate School /Factory of Information Science and Technology 
Address Kita 14, Nishi 9, Kita-ku, Sapporo, Hokkaido, Japan
Transportation Guide https://www.ist.hokudai.ac.jp/eng/access/
Sponsors This conference is co-sponsored by The Japan Society of Applied Physics, IEEE SSCS Japan Chapter and IEEE SSCS Kansai Chapter.
Registration Fee This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on .

Wed, Aug 7 PM 
13:30 - 17:15
(1)
IEICE-SDM
13:30-14:15 [Invited Talk]
A Scalable CMOS Annealing Processor for Solving Large-scale Combinatorial Optimization Problems
Masato Hayashi, Takashi Takemoto, Chihiro Yoshimura, Masanao Yamaoka (Hitachi)
(2)
IEICE-SDM
14:15-14:40 TCAD analysis of the fringe-field effect on transfer characteristics of 2D channel FET Hidehiro Asai, Wen Hsin Chang, Naoya Okada, Koich Fukuda, Toshifumi Irisawa (AIST)
  14:40-14:50 Break ( 10 min. )
(3)
IEICE-ICD
14:50-15:35 [Invited Talk]
"STEAM" for Next IoT/AI
Takahiro Kitayama (KAMAKE no SUSUME)
(4)
IEICE-ICD
15:35-16:20 [Invited Talk]
Ultrafast Photonics Packaging using Room Temperature Bonding
Ryo Takigawa (Kyushu Univ.)
  16:20-16:30 Break ( 10 min. )
(5)
IEICE-SDM
16:30-17:15 [Invited Talk]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics)
  17:15-17:25 Awards ceremony ( 10 min. )
Thu, Aug 8 AM 
09:15 - 17:00
(6)
IEICE-SDM
09:15-10:00 [Invited Talk]
Quantum annealing machine based on NAND flash memory
Tetsufumi Tanamoto (Teikyo Univ.)
(7)
IEICE-SDM
10:00-10:25 Application of Extreme Value Theory to Statistical Analyses of Worst Case SRAM Data Retention Voltage Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo)
(8)
IEICE-SDM
10:25-10:50 [Invited Lecture]
3300V Scaled IGBT Switched by 5V Gate Drive
Toshiro Hiramoto, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (Univ. of Tokyo), Masanori Tsukuda (Green Electronics Research Inst.), Yohichiroh Numasawa (Meiji Univ,), Katsumi Satoh (Mitsubishi Electric Corp), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Wataru Saito (Kyushu Univ.), Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai (Tokyo Inst. of Technology), Atsushi Ogura (Meiji Univ.), Shin-ichi Nishizawa (Kyushu Univ.), Ichiro Omura (Kyushu Inst. of Tech.), Hiromichi Ohashi (Tokyo Inst. of Tech.)
  10:50-11:00 Break ( 10 min. )
(9)
IEICE-ICD
11:00-11:45 [Invited Talk]
Low Noise Low Power MEMS Accelerometer with Digital Noise-Reduction Techniques
Yuki Furubayashi, Takashi Oshima, Yudai Kamada, Atsushi Isobe (Hitachi, Ltd.)
(10)
IEICE-ICD
11:45-12:10 A study of the method to extend a distance for transferring power in a WPT system by using a Q value enhancement technique Yasuhiro Sugimoto (Chuo Univ.), Touma Suzuki (Grad. School of Chuo Univ.)
  12:10-13:10 Lunch Break ( 60 min. )
(11)
IST
13:10-13:55 [Invited Talk]
What is e-Sports? From overview to business development
Suguru Manabe (HESPA)
(12)
IST
13:55-14:20 Gain calibration technique for CMOS terahertz image sensor pixels to compensate the process variation Takahiro Ikegami, Yuma Hirata, Kotaro Sawaguchi, Yuji Nagayasu, Yuri Kanazawa, Masayuki Ikebe (Hokkaido Univ.)
(13)
IST
14:20-14:45 An energy efficient plant monitoring system on drones with edge AI module. Tomoki Kobayashi, Tomoyuki Yokogawa, Nao igawa (Okayama Prefectual Univ.), Satoshi Fujii (National Institute of Tech., Okinawa College), Kazutami Arimoto (Okayama Prefectual Univ.)
  14:45-15:00 Break ( 15 min. )
(14) 15:00-17:00  
Fri, Aug 9 AM 
09:30 - 15:00
(15)
IEICE-SDM
09:30-10:15 [Invited Talk]
A study on a ferroelectric transistor memory with ultrathin IGZO channel
Masaharu Kobayashi, Fei Mo, Yusaku Tagawa, Chengji Jin, MinJu Ahn, Takuya Saraya, Toshiro Hiramoto (Univ. Tokyo)
(16)
IEICE-SDM
10:15-10:40 Fabrication and electrical characteristics of amorphous-ZnSnO/Si bilayer tunnel FETs Kimihiko Kato (Univ. of Tokyo/AIST), Hiroaki Matsui, Hitoshi Tabata, Mitsuru Takenaka, Shinichi Takagi (Univ. of Tokyo)
  10:40-10:50 Break ( 10 min. )
(17)
IEICE-ICD
10:50-11:35 [Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D
Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.)
(18)
IEICE-ICD
11:35-12:00 Interface with Opamp Output-Impedance Calibration Technique for a Large Integrated 2-D Resistive Sensor Array Yohsuke Shiiki, Hiroki Ishikuro (Keio Univ.)
(19)
IEICE-ICD
12:00-12:25 Evaluation of generation and reduction technology of unnecessary radio waves by digital IC chip Kosuke Jike, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ)
  12:25-13:25 Lunch Break ( 60 min. )
(20)
IEICE-SDM
13:25-14:10 [Invited Talk]
Demonstration of Ag Ionic Memory Cell Array for Terabit-Scale High-Density Application
Reika Ichihara, Shosuke Fujii, Marina Yamaguchi, Takuya Konno, Harumi Seki, Hiroki Tanaka, Dandan Zhao, Yoko Yoshimura, Masumi Saitoh, Masato Koyama (TMC)
(21)
IEICE-SDM
14:10-14:35 Effect of Vsub and Positive Charge in Buried Oxide on Super Steep SS “PN Body-Tied SOI-FET” Wataru Yabuki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK)
(22)
IEICE-SDM
14:35-15:00 Ultra Low power rectenna with super SS "PN-Body Tied SOI-FET" Takuya Yamada, Jiro Ida, Takayuki Mori, Nobuhiko Yasumaru, Kenji Itoh (KIT), Koichiro Ishibashi (UEC)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.
Invited TalkEach speech will have 40 minutes for presentation and 5 minutes for discussion.
Invited LectureEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
IST Technical Group on Information Sensing Technologies (IST)   [Latest Schedule]
Contact Address  
IEICE-SDM Technical Committee on Silicon Device and Materials (IEICE-SDM)   [Latest Schedule]
Contact Address  
IEICE-ICD Technical Committee on Integrated Circuits and Devices (IEICE-ICD)   [Latest Schedule]
Contact Address  


Last modified: 2019-06-21 10:13:43


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