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Paper Abstract and Keywords
Presentation 2019-08-07 16:30
[Invited Talk] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics)
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Conference Information
Committee IEICE-SDM IEICE-ICD IST  
Conference Date 2019-08-07 - 2019-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Graduate School /Faculty of Information Science and 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IEICE-SDM 
Conference Code 2019-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications 
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1st Author's Name Takahiro Shimoi  
1st Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
2nd Author's Name Tomoya Saito  
2nd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
3rd Author's Name Hirokazu Nagase  
3rd Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
4th Author's Name Masayuki Izuna  
4th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
5th Author's Name Akihiko Kanda  
5th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
6th Author's Name Takashi Ito  
6th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
7th Author's Name Takashi Kono  
7th Author's Affiliation Renesas Electronics Corporation (Renesas Electronics)
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Date Time 2019-08-07 16:30:00 
Presentation Time 45 minutes 
Registration for IEICE-SDM 
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Volume (vol) vol.43 
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