| Paper Abstract and Keywords |
| Presentation |
2019-08-08 13:55
Gain calibration technique for CMOS terahertz image sensor pixels to compensate the process variation
Takahiro Ikegami, Yuma Hirata, Kotaro Sawaguchi, Yuji Nagayasu, Yuri Kanazawa, Masayuki Ikebe (Hokkaido Univ.) |
| Abstract |
(in Japanese) |
(See Japanese page) |
| (in English) |
We propose a gain compensation mechanism for CMOS terahertz image sensors. Even though we use a MOSFET envelope detector to get the envelope of terahertz (THz) wave, pixel gain variation can occur due to the process variation which affects device parameters. To compensate the pixel variation, we propose to set the operating point by current source calibration. From simulations we confirm that operating point setting can suppress the gain variation. Additionally, this improved compensation mechanism is applicable to global shutter. |
| Keyword |
(in Japanese) |
(See Japanese page) |
| (in English) |
terahertz / terahertz image sensor / CMOS / envelope detector / process variation / variation compensation / global shutter / |
| Reference Info. |
ITE Tech. Rep., vol. 43, no. 25, IST2019-41, pp. 49-52, Aug. 2019. |
| Paper # |
IST2019-41 |
| Date of Issue |
2019-08-01 (IST) |
| ISSN |
Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970 |
| Download PDF |
|
| Conference Information |
| Committee |
IEICE-SDM IEICE-ICD IST |
| Conference Date |
2019-08-07 - 2019-08-09 |
| Place (in Japanese) |
(See Japanese page) |
| Place (in English) |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
| Topics (in Japanese) |
(See Japanese page) |
| Topics (in English) |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
| Paper Information |
| Registration To |
IST |
| Conference Code |
2019-08-SDM-ICD-IST |
| Language |
Japanese |
| Title (in Japanese) |
(See Japanese page) |
| Sub Title (in Japanese) |
(See Japanese page) |
| Title (in English) |
Gain calibration technique for CMOS terahertz image sensor pixels to compensate the process variation |
| Sub Title (in English) |
|
| Keyword(1) |
terahertz |
| Keyword(2) |
terahertz image sensor |
| Keyword(3) |
CMOS |
| Keyword(4) |
envelope detector |
| Keyword(5) |
process variation |
| Keyword(6) |
variation compensation |
| Keyword(7) |
global shutter |
| Keyword(8) |
|
| 1st Author's Name |
Takahiro Ikegami |
| 1st Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 2nd Author's Name |
Yuma Hirata |
| 2nd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 3rd Author's Name |
Kotaro Sawaguchi |
| 3rd Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 4th Author's Name |
Yuji Nagayasu |
| 4th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 5th Author's Name |
Yuri Kanazawa |
| 5th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
| 6th Author's Name |
Masayuki Ikebe |
| 6th Author's Affiliation |
Hokkaido University (Hokkaido Univ.) |
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| Speaker |
Author-1 |
| Date Time |
2019-08-08 13:55:00 |
| Presentation Time |
25 minutes |
| Registration for |
IST |
| Paper # |
IST2019-41 |
| Volume (vol) |
vol.43 |
| Number (no) |
no.25 |
| Page |
pp.49-52 |
| #Pages |
4 |
| Date of Issue |
2019-08-01 (IST) |