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Paper Abstract and Keywords
Presentation 2019-08-08 13:55
Gain calibration technique for CMOS terahertz image sensor pixels to compensate the process variation
Takahiro Ikegami, Yuma Hirata, Kotaro Sawaguchi, Yuji Nagayasu, Yuri Kanazawa, Masayuki Ikebe (Hokkaido Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) We propose a gain compensation mechanism for CMOS terahertz image sensors. Even though we use a MOSFET envelope detector to get the envelope of terahertz (THz) wave, pixel gain variation can occur due to the process variation which affects device parameters. To compensate the pixel variation, we propose to set the operating point by current source calibration. From simulations we confirm that operating point setting can suppress the gain variation. Additionally, this improved compensation mechanism is applicable to global shutter.
Keyword (in Japanese) (See Japanese page) 
(in English) terahertz / terahertz image sensor / CMOS / envelope detector / process variation / variation compensation / global shutter /  
Reference Info. ITE Tech. Rep., vol. 43, no. 25, IST2019-41, pp. 49-52, Aug. 2019.
Paper # IST2019-41 
Date of Issue 2019-08-01 (IST) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
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Conference Information
Committee IEICE-SDM IEICE-ICD IST  
Conference Date 2019-08-07 - 2019-08-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ., Graduate School /Faculty of Information Science and 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IST 
Conference Code 2019-08-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Gain calibration technique for CMOS terahertz image sensor pixels to compensate the process variation 
Sub Title (in English)  
Keyword(1) terahertz  
Keyword(2) terahertz image sensor  
Keyword(3) CMOS  
Keyword(4) envelope detector  
Keyword(5) process variation  
Keyword(6) variation compensation  
Keyword(7) global shutter  
Keyword(8)  
1st Author's Name Takahiro Ikegami  
1st Author's Affiliation Hokkaido University (Hokkaido Univ.)
2nd Author's Name Yuma Hirata  
2nd Author's Affiliation Hokkaido University (Hokkaido Univ.)
3rd Author's Name Kotaro Sawaguchi  
3rd Author's Affiliation Hokkaido University (Hokkaido Univ.)
4th Author's Name Yuji Nagayasu  
4th Author's Affiliation Hokkaido University (Hokkaido Univ.)
5th Author's Name Yuri Kanazawa  
5th Author's Affiliation Hokkaido University (Hokkaido Univ.)
6th Author's Name Masayuki Ikebe  
6th Author's Affiliation Hokkaido University (Hokkaido Univ.)
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Speaker Author-1 
Date Time 2019-08-08 13:55:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2019-41 
Volume (vol) vol.43 
Number (no) no.25 
Page pp.49-52 
#Pages 4 
Date of Issue 2019-08-01 (IST) 

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