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All Technical Committee Conferences (Searched in: Recent 10 Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2021-01-29
14:00 |
Online |
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Hiroshi Nishino, Hiroshi Tsunoda, Ryo Suzuki, Kazuo Ozaki, Hiroyasu Yamashita, Satoshi Kawada, Yasuo Matsumiya (FUJITSU LAB.) |
[more] |
IST2021-2
pp.5-8 |
| IEICE-MI, IEICE-IE, IEICE-SIP, IEICE-BioX, IST, ME [detail] |
2020-05-29
14:30 |
Online |
Online |
A method for analyze causes of deterioration of predict quality when Deep Learning is applied to instance segmentation
Tomonori Kubota, Takanori Nakao, Masafumi Katoh, Eiji Yoshida, Hidenobu Miyoshi (Fujitsu Lab.) |
In this paper, we propose a method to analyze the cause of deterioration of prediction accuracy in instance segmentation... [more] |
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| IST |
2020-01-30
15:45 |
Tokyo |
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*
Koji Tsunoda, Hiroshi Nishino, Ryo Suzuki, Kazuo Ozaki, Yasuo Matsumiya, Yuichi Yamasaki (FUJITSU LABORATORIES) |
[more] |
IST2020-7
pp.21-24 |
| IST, ME, IEICE-BioX [detail] |
2019-06-07
14:00 |
Ishikawa |
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A Study for the Accuracy Analysis on Biometric Bit-string Feature using Multi-instance
Rikuhiro Kojima, Hajime Nada, Hidetsugu Uchida, Narishige Abe, Tomoaki Matsunami (FLL) |
[more] |
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| IST |
2019-01-30
14:00 |
Tokyo |
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Development of Cooled Infrared Sensors and their Applications
Koji Tsunoda, Yasuo Matsumiya, Ryo Suzuki, Hironori Nishino (Fujitsu Laboratories), Kotaro Yamazaki, Yuma Tateno, Haruka Nakajima, Tetsuya Miyatake, Akira Noda, Takamitsu Ishida (Fujitsu) |
[more] |
IST2019-4
pp.11-14 |
| IST, IEICE-ICD, IEICE-SDM |
2018-08-07
16:00 |
Hokkaido |
Hokkaido University M Bldg. M151 |
[Invited Talk]
A Battery Management System with a Low-Power State of Charge Monitoring Method and an Intermittently Enabled Coulomb Counter for IoT Devices
Ken-ichi Kawasaki, Jun-ichi Nagata, Hiroyuki Nakamoto (Fujitsu Labs.) |
[more] |
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| ME, IST, IEICE-BioX [detail] |
2018-05-24
15:45 |
Ishikawa |
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A probabilistic verification method using multi-feature for environment-robust biometrix
Hidetsugu Uchida, Narishige Abe, Shigefumi Yamada (FUJITSU LAB.) |
[more] |
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| ME, IST, IEICE-BioX [detail] |
2018-05-24
16:30 |
Ishikawa |
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[Invited Talk]
Continuous Authentication by Just Watching the Screen
-- the Possibilities and the Limitation of Eye Movement Authentication --
Narishige Abe (FUJITSU LAB.) |
[more] |
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| IEICE-MRIS, MMS |
2015-10-22
13:30 |
Osaka |
Osaka Univ. |
Dynamic analysis of magnetization process in amorphous wires for MI sensor based on micromagnetic simulation
Yuji Uehara, Atsushi Furuya, Koichi Shimizu, Jun Fujisaki, Tadashi Ataka, Tomohiro Tanaka (Fujitsu), Hirotaka Oshima (Fujitsu Lab.) |
[more] |
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