ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
|
|
All Technical Committee Conferences (Searched in: Recent 10 Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| AIT, ME, MMS, IEICE-IE, IEICE-ITS [detail] |
2022-02-21
12:45 |
Online |
online |
Quality Assessment for 3D CG Image Colorization Using Visible Digital Watermarking after Noise Removal Based on Sparse Dictionary Learning Coding
Norifumi Kawabata (Hokkaido Univ.) |
Thus far, we discussed to represent image data whether it is possible or not to represent meaning image how requirement ... [more] |
MMS2022-6 ME2022-31 AIT2022-6
pp.31-36 |
| IEICE-LOIS, IEICE-EMM, IEICE-IE, IEE-CMN, ME, IPSJ-AVM [detail] |
2021-08-25
13:25 |
Online |
Online |
Extraction of watermarks from video frames by using BSS
Akane Yokota, Masaki Kawamura (Yamaguchi Univ.) |
We propose a method for extracting watermarks additively
embedded in video frames by using blind source separation (BS... [more] |
|
| HI, IEICE-IE, IEICE-ITS, MMS, ME, AIT [detail] |
2020-02-27
11:30 |
Hokkaido |
Hokkaido Univ.
(Cancelled) |
A High Embedding Capacity Watermarking Technique Based on Regularization for Convolutional Neural Network Model
Han He, Seok Kang, Yuji Sakamoto (Hokkaido Univ.) |
CNN (Convolutional Neural Network) is becoming more and more popular. And pre-trained CNN models can be accessed easily.... [more] |
MMS2020-8 HI2020-8 ME2020-36 AIT2020-8
pp.41-46 |
| IEICE-IE, IEICE-EMM, IEICE-LOIS, IEE-CMN, ME, IPSJ-AVM [detail] |
2019-09-19
15:35 |
Niigata |
Tokimeito, Niigata University |
Digital watermarking method against print-cam attack using deep learning for synchronization
Hiroyuki Imagawa, Motoi Iwata, Koichi Kise (Osaka Pref. Univ.) |
In this paper, we propose a novel watermarking method against print-cam attack.
Digital watermarking is used to get inf... [more] |
|
|
|
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|