Print edition: ISSN 1342-6893 Online edition: ISSN 2424-1970
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IST2017-8
[Invited Talk]
Enhancing Techniques of Image Processing and Recognition with Advanced Imaging
Daisuke Sugimura (TUS)
p. 1
IST2017-9
A 1ms High-Speed Vision Chip with 3D-Stacked 140GOPS Column-Parallel PEs for Spatio-Temporal Image Processing
Masatsugu Kobayashi, Tomohiro Yamazaki, Hironobu Katayama, Shuji Uehara, Atsushi Nose, Sayaka Shida (Sony Semiconductor Solutions Co.), Masaki Odahara, Kenichi Takamiya, Yasuaki Hisamatsu, Shizunori Matsumoto (Sony LSI Design Inc.), Leo Miyashita, Yoshihiro Watanabe (University of Tokyo), Takashi Izawa, Yoshinori Muramatsu (Sony Semiconductor Solutions Co.), Masatoshi Ishikawa (University of Tokyo)
pp. 3 - 6
IST2017-10
An Ultra-High Speed Global Shutter CMOS Image Sensor with High Density Analog Memories
Manabu Suzuki, Masashi Suzuki, Rihito Kuroda (Tohoku Univ.), Yuki Kumagai, Akira Chiba, Noriyuki Miura, Naoya Kuriyama (LAPIS Semi. Miyagi), Shigetoshi Sugawa (Tohoku Univ.)
pp. 7 - 10
IST2017-11
Low Temporal Noise and High Dynamic Range Global Shutter CMOS Image Sensor with Multiple Accumulation Shutter
Yusuke Onuki, Masahiro Kobayashi, Kazunari Kawabata, Hiroshi Sekine, Toshiki Tsuboi, Yasushi Matsuno, Hidekazu Takahashi, Toru Koizumi, Katsuhito Sakurai, Hiroshi Yuzurihara, Shunsuke Inoue, Takeshi Ichikawa (Canon)
pp. 11 - 14
IST2017-12
Flicker-free method for video captured at 120-Hz frame frequency by interlaced scanning and electrical shutter
Toshiki Arai, Hiroshi Ohtake (NHK)
pp. 15 - 18
IST2017-13
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions)
pp. 19 - 22
IST2017-14
Design of an 8-tap CMOS lock-in pixel with lateral electric field charge modulator for highly time-resolved imaging
Yuya Shirakawa, Min-Woong Seo, Keita Yasutomi, Keiichiro Kagawa, Nobukazu Teranishi, Shoji Kawahito (Shizuoka Univ.)
pp. 23 - 26
IST2017-15
A High SNR Multi-Tap Lock-In Pixel CMOS Image Sensors
Min-Woong Seo, Yuya Shirakawa, Yuriko Masuda, Yoshimasa Kawata, Keiichiro Kagawa, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.)
pp. 27 - 30
IST2017-16
Four-Directional Pixel-Wise Polarization CMOS Image Sensor Using Air-Gap Wire Grid on 2.5-μm Back-Illuminated Pixels
Yusuke Uesaka (Sony Semiconductor Solutions Corporation), Tomohiro Yamazaki (Sony Semiconductor Manufacturing Corporation), Yasushi Maruyama, Motoaki Nakamura, Yoshihisa Matoba (Sony Semiconductor Solutions Corporation), Takashi Terada, Kenta Komori, Yoshiyuki Ohba, Shinichi Arakawa (Sony Semiconductor Manufacturing Corporation), Yasutaka Hirasawa, Yuhi Kondo, Jun Murayama (Sony), Kentaro Akiyama, Yusuke Oike, Shuzo Sato (Sony Semiconductor Solutions Corporation)
pp. 31 - 34
IST2017-17
A Low Read Noise High Conversion Gain CMOS Image Sensors using Reset-Gate-Less Pixel
Min-Woong Seo, Tong xi Wang (Shizuoka Univ.), Sung-Wook Jun, Tomoyuki Akahori (Brookman Tech.), Shoji Kawahito (Shizuoka Univ.)
pp. 35 - 38
IST2017-18
A high sensitivity and high readout speed electron beam detector using steep pn junction Si diode technology for low acceleration voltage
Rihito Kuroda, Yasumasa Koda, Masaya Hara, Hiroyuki Tsunoda, Shigetoshi Sugawa (Tohoku Univ.)
pp. 39 - 42
IST2017-19
Organic-Film Stacked RGB-IR Image Sensor with Electrically Controllable NIR Sensitivity
Shin'ichi Machida, Sanshiro Shishido, Takeyoshi Tokuhara, Masaaki Yanagida, Takayoshi Yamada, Masumi Izuchi, Yoshiaki Sato, Yasuo Miyake, Manabu Nakata, Masashi Murakami, Mitsuru Harada, Yasunori Inoue (Panasonic)
pp. 43 - 46
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.