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Paper Abstract and Keywords
Presentation 2022-08-09 14:00
High-precision small capacitance difference measurement using proximity capacitance sensor
Yoshiaki Watanabe, Yuki Sugama, Yoshinobu Shiba, Rihito Kuroda, Yasuyuki Shirai, Shigetoshi Sugawa (Tohoku Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) A proximity capacitance sensor for measuring small capacitance differences was designed and fabricated using 0.18 μm CMOS technology. Measurements of the prototype sensors were performed, and good linearity over a wide capacitance range in the input-output characteristics and low noise measurement by noise cancelling operation were achieved .The optimal system parameters for measuring small capacitance differences with high accuracy were investigated, and it was found that when the measurement capacitance value is close to the detection electrode parasitic capacitance value, -higher sensitivity is obtained toward measurement of small capacitance difference measurement. Based on these results, small capacitance change measurements were performed and a detection of small capacitance changes of 1 % relative to the back-ground capacitance was confirmed.
Keyword (in Japanese) (See Japanese page) 
(in English) Proximity Capacitance / Sensor / High Precision / Small Capacitance Difference / Noise Cancelling / / /  
Reference Info. ITE Tech. Rep., vol. 46, no. 23, IST2022-31, pp. 71-76, Aug. 2022.
Paper # IST2022-31 
Date of Issue 2022-08-01 (IST) 
ISSN Print edition: ISSN 1342-6893    Online edition: ISSN 2424-1970
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Conference Information
Committee IEICE-ICD IEICE-SDM IST  
Conference Date 2022-08-08 - 2022-08-10 
Place (in Japanese) (See Japanese page) 
Place (in English) On-line 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications 
Paper Information
Registration To IST 
Conference Code 2022-08-ICD-SDM-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High-precision small capacitance difference measurement using proximity capacitance sensor 
Sub Title (in English)  
Keyword(1) Proximity Capacitance  
Keyword(2) Sensor  
Keyword(3) High Precision  
Keyword(4) Small Capacitance Difference  
Keyword(5) Noise Cancelling  
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1st Author's Name Yoshiaki Watanabe  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Yuki Sugama  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Yoshinobu Shiba  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Rihito Kuroda  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name Yasuyuki Shirai  
5th Author's Affiliation Tohoku University (Tohoku Univ.)
6th Author's Name Shigetoshi Sugawa  
6th Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2022-08-09 14:00:00 
Presentation Time 25 minutes 
Registration for IST 
Paper # IST2022-31 
Volume (vol) vol.46 
Number (no) no.23 
Page pp.71-76 
#Pages
Date of Issue 2022-08-01 (IST) 


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