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Chair |
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Masayuki Ikebe (Hokkaido Univ.) |
Vice Chair |
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Takashi Komuro (Saitama Univ.), Kazuhiro Shimonomura (Ritsmeikan Univ.), Keiichiro Kagawa (Shizuoka Univ.) |
Secretary |
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Takashi Tokuda (Tokyo Inst. of Tech.), Rihito Kuroda (Tohoku Univ.), Kazuya Kitamura (NHK), Yuichiro Yamashita (TSMC), Shunsuke Okura (Ritsumeikan Univ.), Yoshiaki Takemoto (MEMS CORE) |
Assistant |
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Junichi Akita (Kanazawa Univ.) |
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Chair |
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Shunichiro Ohmi (Tokyo Inst. of Tech.) |
Vice Chair |
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Tatsuya Usami (Rapidus) |
Secretary |
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Tomoyuki Suwa (Tohoku Univ.), Taiji Noda (Panasonic) |
Assistant |
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Takuji Hosoi (Kwansei Gakuin Univ.), Takuya Futase (Western Digital) |
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Chair |
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Makoto Ikeda (Univ. of Tokyo) |
Vice Chair |
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Hayato Wakabayashi (Sony Semiconductor Solutions) |
Secretary |
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Yoshiaki Yoshihara (Kioxia), Kosuke Miyaji (Shinshu Univ.) |
Assistant |
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Ryo Shirai (Kyoto Univ.), Jun Shiomi (Osaka Univ.), Takeshi Kuboki (Sony Semiconductor Solutions) |
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Conference Date |
Tue, Aug 1, 2023 10:00 - 17:00
Wed, Aug 2, 2023 09:00 - 17:00
Thu, Aug 3, 2023 09:30 - 15:30 |
Topics |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
Conference Place |
Hokkaido Univ. Multimedia Education Bldg. 3F |
Address |
Kita 14, Nishi 9, Kita-ku, Sapporo, Hokkaido, Japan |
Transportation Guide |
https://www.ist.hokudai.ac.jp/eng/access/ |
Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on IST. |
Tue, Aug 1 AM 10:00 - 13:00 |
(1) IEICE-ICD |
10:00-10:45 |
[Invited Talk]
Development of small-size high-resolution cyclic ADC with latest CMOS technology |
Takashi Oshima, Keisuke Yamamoto, Goichi Ono (Hitachi) |
(2) IEICE-ICD |
10:45-11:10 |
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices. |
Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
(3) IEICE-ICD |
11:10-11:35 |
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature |
Misato Taguchi, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
(4) IST |
11:35-12:00 |
Linearity improvement of VCO based ADC with low power suplly voltage via complimentary bias voltage control |
Yoshihiro Komatsu, Takuto Togashi, Pitchayapatchaya Srikram, Masayuki Ikebe (Hokkaido Univ.) |
|
12:00-13:00 |
Lunch Break ( 60 min. ) |
Tue, Aug 1 PM 13:00 - 17:00 |
(5) IEICE-ICD |
13:00-13:45 |
[Invited Talk]
R and D of Low Power Semiconductor Technology and It's Application Expansio
-- Review R and D of Semiconductor device and LSI for these 43 years -- |
Koichiro Ishibashi (UEC) |
(6) IEICE-ICD |
13:45-14:30 |
[Invited Talk]
Research Trends in Low Power Sensors and Wireless Technology |
Shiro Dosho, Noboru Ishihara, Hiroyuki Ito (TIT) |
(7) IST |
14:30-15:15 |
[Invited Talk]
Low-bitwidth Parallel-Processing AI Engines for Edge Intelligence |
Masato Motomura (Tokyo Tech) |
|
15:15-15:25 |
Break ( 10 min. ) |
(8) IEICE-SDM |
15:25-16:10 |
[Invited Talk]
Low-Frequency Noise Source in Cryogenic Operation of Short-Channel Bulk MOSFETs |
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) |
(9) IEICE-SDM |
16:10-16:35 |
Additional High-Pressure Hydrogen Annealing Improving the Cryogenic Operation of Si (110)-oriented n-MOSFETs |
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Takumi Inaba, Shota Iizuka, Kimihiko Kato, Takahiro Mori (AIST) |
(10) IEICE-SDM |
16:35-17:00 |
Analysis of back bias effects and history phenomena in cryo 200nm SOIMOSFETs |
Ryusei Ri, Takayuki Mori (KIT), Hiroshi Oka, Takahiro Mori (AIST), Jiro Ida (KIT) |
Wed, Aug 2 AM 09:00 - 13:15 |
(11) IEICE-ICD |
09:00-09:45 |
[Invited Talk]
A 33kDMIPS 6.4W Vehicle Communication Gateway Processor Achieving 10Gbps/W Network Routing, 40ms CAN Bus Start-Up and 1.4mW Standby Power |
Kenichi Shimada, Keiichiro Sano, Kazuki Fukuoka, Hiroshi Morita, Masayuki Daito, Tatsuya Kamei, Hiroyuki Hamasaki, Yasuhisa Shimazaki (Renesas) |
(12) IEICE-ICD |
09:45-10:10 |
A 1W/8R 20T SRAM Codebook for Deep Learning Processors to Reduce Main Memory Bandwidth |
Ryotaro Ohara, Masaya Kabuto, Masakazu Taichi, Atsushi Fukunaga, Yuto Yasuda, Riku Hamabe, Shintaro Izumi, Hiroshi Kawaguchi (Kobe Univ) |
(13) IST |
10:10-10:35 |
A Small-Area and Highly-Linear Column Readout Circuit for LOFIC CMOS Image Sensor |
Ryotaro Hotta, Shunsuke Okura, Ai Otani, Kazuki Tatsuta (Ritsmeikan), Ken Miyauchi, Han Sangman, Hideki Owada, Isao Takayanagi (Brillnics) |
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10:35-10:45 |
Break ( 10 min. ) |
(14) IST |
10:45-11:30 |
[Invited Talk]
The Image Sensor Technology: Building the Foundation for Information Sensing Societies and Fusion of Imaging |
Hayato Wakabayashi (Sony Semiconductor Solutions) |
(15) IST |
11:30-12:15 |
[Invited Talk]
Multimodal flexible sensor system |
Kuniharu Takei (Hokkaido Univ.) |
|
12:15-13:15 |
Lunch Break ( 60 min. ) |
Wed, Aug 2 PM 13:15 - 17:00 |
(16) IEICE-SDM |
13:15-14:00 |
[Invited Talk]
A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel and InSnOx Electrode for 3D Integrated Devices |
Masaharu Kobayashi, Kaito Hikake, Zhuo Li, Junxiang Hao, Chitra Pandy, Takuya Saraya, Toshiro Hiramoto (Univ. Tokyo), Takanori Takahashi, Mutsunori Uenuma, Yukiharu Uraoka (NAIST) |
(17) IEICE-SDM |
14:00-14:45 |
[Invited Talk]
The Latest Technology Trends in Devices for Advanced Logic LSIs
-- FinFET, BS-PDN, GAA-NS-FET, CFET, 2D-CFET -- |
Hitoshi Wakabayashi (Tokyo Tech) |
(18) IEICE-SDM |
14:45-15:10 |
Multi-Output MOSFET for Standard Sensor/Circuit Design Platform Device |
Tomochika Harada (Yamagata University) |
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15:10-15:20 |
Break ( 10 min. ) |
(19) |
15:20-17:00 |
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Thu, Aug 3 AM 09:30 - 13:00 |
(20) IEICE-SDM |
09:30-10:15 |
[Invited Talk]
Present status and future perspective for two dimensional material devices |
Kosuke Nagashio (UTokyo) |
(21) IEICE-SDM |
10:15-11:00 |
[Invited Talk]
Demonstration of Recovery Annealing on 7-Bits per Cell 3D Flash Memory at Cryogenic Operation for Bit Cost Scalability and Sustainability |
Yuta Aiba, Hitomi Tanaka, Hiroki Tanaka, Fumie Kikushima, Toshio Fujisawa, Hideko Mukaida, Tomoya Sanuki (KIOXIA) |
|
11:00-11:10 |
Break ( 10 min. ) |
(22) IST |
11:10-11:35 |
Stabilizing Variable Filters Using Inverse Trigonometric Functions |
Tian-Bo Deng (Toho Univ.) |
(23) IST |
11:35-12:00 |
A method for analyzing chlorophyll-a concentration in the seawater surface layer by image hue analysis. |
Shunya Kosako, Toshihiko Hamasaki (HIT) |
|
12:00-13:00 |
Break ( 60 min. ) |
Thu, Aug 3 PM 13:00 - 15:30 |
(24) IEICE-ICD |
13:00-13:45 |
[Invited Talk]
Energy Field, Computer Shape |
Noriyuki Miura (Osaka Univ.) |
(25) IEICE-ICD |
13:45-14:30 |
[Invited Talk]
Study and Development of Load-Adaptive Active Gate Driver Integrated Circuit for Power Device |
Shusuke Kawai, Takeshi Ueno, Koutaro Miyazaki, Satoshi Takaya (Toshiba), Kohei Onizuka (Toshiba Europe Limited), Hiroaki Ishihara (Toshiba) |
|
14:30-14:40 |
Break ( 10 min. ) |
(26) IEICE-ICD |
14:40-15:05 |
Real-Time Gate Current Change Gate Driver IC to Adapt to Operating Condition Variations of SiC MOSFETs |
Dibo Zhang, Kohei Horii, Katsuhiro Hata, Makoto Takamiya (UTokyo) |
(27) IEICE-ICD |
15:05-15:30 |
Gate Driver IC with Fully Integrated Overcurrent Protection by Measuring Gate-to-Emitter Voltage |
Haifeng Zhang, Dibo Zhang, Hiromu Yamasaki, Katsuhiro Hata (Univ. of Tokyo), Keiji Wada (Tokyo Metropolitan Univ.), Kan Akatsu (Yokohama National Univ.), Ichiro Omura (Kyusyu Institute of Technology), Makoto Takamiya (Univ. of Tokyo) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Invited Talk | Each speech will have 40 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
IST |
Technical Group on Information Sensing Technologies (IST) [Latest Schedule]
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Contact Address |
Masayuki Ikebe (Hokkaido university)
E- : i be ist![](/ken/images/new/tod.gif) ![](/ken/images/new/1217oh.bmp) ![](/ken/images/new/1111uqde.gif) i |
IEICE-SDM |
Technical Committee on Silicon Device and Materials (IEICE-SDM) [Latest Schedule]
|
Contact Address |
Kiwamu SAKUMA (KIOXIA Corporation)
E- : ![](/ken/images/new/1111tdad.gif) ![](/ken/images/new/1217aw.bmp) ![](/ken/images/new/1217um.bmp) ![](/ken/images/new/tod.gif) ![](/ken/images/new/1111uqds.gif) ![](/ken/images/new/1111uqde.gif) ![](/ken/images/new/1217am.bmp) ![](/ken/images/new/ta.gif) oxia |
IEICE-ICD |
Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [Latest Schedule]
|
Contact Address |
Kousuke Miyaji (Shinshu university)
E- : k![](/ken/images/new/1217im.bmp) ![](/ken/images/new/1217ay.bmp) ![](/ken/images/new/1217ij.bmp) ![](/ken/images/new/ta.gif) nshu-u |
Last modified: 2023-07-25 13:16:02
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