Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST, IEICE-ICD |
2011-07-21 09:30 |
Hiroshima |
Hiroshima Institute of Technology |
A Level Shifter with Logic Error Correction Circuit for Low-Voltage Digital LSIs Yuji Osaki, Tetsuya Hirose, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-21 09:55 |
Hiroshima |
Hiroshima Institute of Technology |
A Sense Amplifier with High Speed Pre-Charge Operation for Ultra-Low-Voltage SRAM Chotaro Masuda, Tetsuya Hirose, Yuji Osaki, Nobutaka Kuroki, Masahiro Numa (Kove Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-21 10:20 |
Hiroshima |
Hiroshima Institute of Technology |
Low-power CMOS logic circuits consisting of cascode structure Keishi Kubo, Masayuki Ikebe, Yoshihito Amemiya, Eiichi Sano (Hokkaido Univ.) |
We propose using a stack structure to lower the energy consumption of battery-operated CMOS logic circuits. In our stack... [more] |
IST2011-44 pp.13-18 |
IST, IEICE-ICD |
2011-07-21 10:55 |
Hiroshima |
Hiroshima Institute of Technology |
Wireless transmission of image sensor signal via a mouse brain Kiyotaka Sasagawa (NAIST), Takashi Matsuda (NICT), Peter Davis (Telecognix), Bing Zhang, Keren Li (NICT), Takuma Kobayashi, Toshihiko Noda, Takashi Tokuda, Jun Ohta (NAIST) |
[more] |
IST2011-45 pp.19-23 |
IST, IEICE-ICD |
2011-07-21 11:20 |
Hiroshima |
Hiroshima Institute of Technology |
64ch Neural Recording Chip for Human Brain-Machine Interfaces Takeshi Yoshida, Katsuya Sueishi (Hiroshima Univ.), Masahiro Ono (A-R-Tec), Hiroshi Ando (Hiroshima Univ.), Atsushi Iwata (A-R-Tec), Kojiro MNatsushita, Masayuki Hirata (Osaka Univ.), Takafumi Suzuki (Univ. of Tokyo) |
[more] |
|
IST, IEICE-ICD |
2011-07-21 11:45 |
Hiroshima |
Hiroshima Institute of Technology |
Design of Radical Sensor LSI with RF-CMOS Technology Shunsuke Kimura, Akio Kitagawa, Junichi Akita (Kanazawa Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-21 13:10 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Technology trends and market opportunities for image sensors for automotive market Yuji Kitamura (Aptina) |
[more] |
IST2011-46 pp.37-41 |
IST, IEICE-ICD |
2011-07-21 14:00 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
An All-Digital Time A/D Converter TAD for Digital Sensors
-- High-Temperature Operation and Multi-Function Application -- Takamoto Watanabe (DENSO) |
In recent years, sensor technology has become one of the most important and critical items for many sophisticated system... [more] |
IST2011-47 pp.43-48 |
IST, IEICE-ICD |
2011-07-21 15:00 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Space Environment Characteristics of the On-board Earth-observation Sensor Nagamitsu Ohgi (JAROS) |
[more] |
IST2011-48 pp.49-52 |
IST, IEICE-ICD |
2011-07-21 15:50 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Radiation Imaging Detector with SOI Technology Yasuo Arai (KEK) |
[more] |
IST2011-49 pp.53-56 |
IST, IEICE-ICD |
2011-07-22 09:00 |
Hiroshima |
Hiroshima Institute of Technology |
A 100V AC Energy Meter with Organic CMOS Circuits Koichi Ishida, Tsung-Ching Huang, Kentaro Honda, Tsuyoshi Sekitani (Univ. of Tokyo), Hiroyoshi Nakajima, Hiroki Maeda (Dai Nippon Printing), Makoto Takamiya, Takao Someya, Takayasu Sakurai (Univ. of Tokyo) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 09:25 |
Hiroshima |
Hiroshima Institute of Technology |
An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo) |
This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring o... [more] |
|
IST, IEICE-ICD |
2011-07-22 09:50 |
Hiroshima |
Hiroshima Institute of Technology |
On-Chip Resonant Supply Noise Reduction Using Active Decoupling Capacitors Jinmyoung Kim (Tokyo Univ.), Toru Nakura (VDEC), Hidehiro Takata, Koichiro Ishibashi (Renesas Electronics), Makoto Ikeda, Kunihiro Asada (VDEC) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 10:50 |
Hiroshima |
Hiroshima Institute of Technology |
A Diagnosis Testbench of Analog IP Cores Against On-Chip Environmental Disturbances Yuuki Araga, Takushi Hashida, Shinichiro Ueyama, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 11:15 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Noise Reduction Technology for RFIC receiver of LTE-Class Cell Phone Handset
-- From the View Point of Magnetic Near Field Measurement and Countermeasure -- Masahiro Yamaguchi, Yasushi Endo (Tohoku Univ.), Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 13:05 |
Hiroshima |
Hiroshima Institute of Technology |
[Invited Talk]
Technology Trends in Data Converters
-- July 2011 -- Takahiro Miki, Tatsuji Matsuura (Renesas Electronics) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 13:55 |
Hiroshima |
Hiroshima Institute of Technology |
Analog Design Optimization with gm/ID Lookup Table Design Methodology Takayuki Konishi, Takaaki Nagashima, Ben Patrick (Tohoku Univ.), Takana Kaho (NTT), Shoichi Masui (Tohoku Univ.) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 14:20 |
Hiroshima |
Hiroshima Institute of Technology |
Concise method of minimum power consumption design of CMOS amplifier using EXCEL sheet. Masayuki Uno (Linear Cell Design) |
[more] |
|
IST, IEICE-ICD |
2011-07-22 14:45 |
Hiroshima |
Hiroshima Institute of Technology |
Ultra Low-Voltage PWM-Driven Analog Amplifier with Weak Inversion Tomochika Harada, Ryuuya Otaki (Yamagata Univ.) |
[more] |
|