Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IST, IEICE-ICD |
2010-07-22 09:30 |
Osaka |
Josho Gakuen Osaka Center |
On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 09:55 |
Osaka |
Josho Gakuen Osaka Center |
The Minimal Structure of On-Chip Monitoring and Application to Evaluation of Chip Environments Yuuki Araga, Takushi Hashida, Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 10:45 |
Osaka |
Josho Gakuen Osaka Center |
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo) |
In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse co... [more] |
|
IST, IEICE-ICD |
2010-07-22 11:20 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
Digital Calibration and Correction Methods for CMOS-ADCs Shiro Dosho (Pana) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 12:10 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
A 10b 50MS/s 820uW SAR ADC with on-chip digital calibration Sanroku Tsukamoto (Fujitsu Labs.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 14:00 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
Digitally-Assisted Analog Test Technology Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 14:50 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
Trend in Multi-mode Multi-band transceivers Hisayasu Sato (Renesas) |
[more] |
|
IST, IEICE-ICD |
2010-07-22 15:50 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
A 2.1-to-2.8-GHz Low-Phase-Noise All-Digital Frequency Synthesizer with a Time-Windowed Time-to-Digital Converter Tadashi Maeda, Takashi Tokairin (Renesas), Masaki Kitsunezuka (NEC), Mitsuji Okada (Renesas), Muneo Fukaishi (NEC) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 09:15 |
Osaka |
Josho Gakuen Osaka Center |
Implementation of a CMOS Subthreshold Analog Amplifier using 0.5V Power Supply Tomochika Harada (Yamagata Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 09:40 |
Osaka |
Josho Gakuen Osaka Center |
OTA Design Using gm/ID Lookup Table Methodology
-- Featuring Settling Time Optimization -- Toru Kashimura, Takayuki Konishi, Shoichi Masui (Tohoku Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 10:05 |
Osaka |
Josho Gakuen Osaka Center |
Considerations of a common-mode feedback circuit in the CMOS inverter-based differential amplifier. Masayuki Uno (Linear Cell Design) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 10:30 |
Osaka |
Josho Gakuen Osaka Center |
The Design of a Gm Amplifier with the Improved Linearity by Using the Positive Feedback Compensation Scheme and its Application to High-frequency Filter Design Yusuke Shimoyama, Yasuhiro Sugimoto (Chuo Univ.) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 11:05 |
Osaka |
Josho Gakuen Osaka Center |
On-chip background calibration of time-interleaved ADC Takashi Oshima, Tomomi Takahashi (Hitachi) |
[more] |
|
IST, IEICE-ICD |
2010-07-23 11:30 |
Osaka |
Josho Gakuen Osaka Center |
A/D converter for CMOS Image Sensor with a variable gain amplifier features Tetsuya Iida, Tomoyuki Akahori (BT), Mohd Amrallah Bin Mustafa, Keita Yastomi, Shoji Kawahito (Shizuoka Univ.) |
[more] |
IST2010-36 pp.85-88 |
IST, IEICE-ICD |
2010-07-23 11:55 |
Osaka |
Josho Gakuen Osaka Center |
Interleaved ramp wave generator for single slope ADC Yukinobu Makihara, Shin Muon, Masayuki Ikebe, Junichi Motohisa, Eiichi Sano (Hokkaido Univ.) |
[more] |
IST2010-37 pp.89-93 |
IST, IEICE-ICD |
2010-07-23 13:20 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
An All-Digital and Scalable Time-Mode A/D Converter TAD
-- Challenge for Sensor Circuit Digitalization -- Takamoto Watanabe (DENSO) |
In recent years, sensor technology has become one of the most important and critical items for many sophisticated system... [more] |
IST2010-38 pp.95-100 |
IST, IEICE-ICD |
2010-07-23 14:10 |
Osaka |
Josho Gakuen Osaka Center |
[Invited Talk]
TDC and SOI Radiation Image Sensor for Particle Physics Yasuo Arai (KEK IPNS) |
[more] |
IST2010-39 pp.101-106 |
IST, IEICE-ICD |
2010-07-23 15:10 |
Osaka |
Josho Gakuen Osaka Center |
Low noise sensor signal readout circuits with a response time acceleration technique Mars Kamel, Kawahito Shoji (Shizuoka Univ.) |
[more] |
IST2010-40 pp.107-110 |
IST, IEICE-ICD |
2010-07-23 15:35 |
Osaka |
Josho Gakuen Osaka Center |
Design and Development of Polarization-Analyzing Image Sensor using 65nm CMOS Process Sanshiro Shishido, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda, Jun Ohta (NAIST) |
[more] |
IST2010-41 pp.111-114 |