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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-09
14:00 |
Online |
On-line |
High-precision small capacitance difference measurement using proximity capacitance sensor
Yoshiaki Watanabe, Yuki Sugama, Yoshinobu Shiba, Rihito Kuroda, Yasuyuki Shirai, Shigetoshi Sugawa (Tohoku Univ.) |
A proximity capacitance sensor for measuring small capacitance differences was designed and fabricated using 0.18 μm CMO... [more] |
IST2022-31
pp.71-76 |
| IST |
2021-10-21
10:50 |
Online |
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High-precision CMOS Proximity Capacitance Image Sensors with Large-format 12 µm and High-resolution 2.8 µm Pixels
Yuki Sugama, Yoshiaki Watanabe, Rihito Kuroda, Masahiro Yamamoto, Tetsuya Goto (Tohoku Univ.), Toshiro Yasuda, Shinichi Murakami, Hiroshi Hamori (OHT), Naoya Kuriyama (LAPIS Semiconductor), Shigetoshi Sugawa (Tohoku Univ.) |
This paper presents newly developed two high-precision CMOS proximity capacitance image sensors: Chip A with 12 µm pitch... [more] |
IST2021-51
pp.13-16 |
| IEICE-SDM, IEICE-ICD, IST [detail] |
2021-08-17
09:30 |
Online |
Online |
[Invited Talk]
Development of sub-aF accuracy high resolution and realtime CMOS proximity capacitance image sensors
Rihito Kuroda, Yuki Sugama, Yoshiaki Watanabe, Tetsuya Goto, Shigetoshi Sugawa (Tohoku Univ.) |
[more] |
IST2021-41
pp.1-4 |
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