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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
IEICE-ICD, IEICE-SDM, IST [detail] 2022-08-08
09:00
Online On-line [Invited Talk] A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency
Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions)
 [more]
IST, CE 2012-03-30 Tokyo Kikai-Shinko-Kaikan Bldg. Extremely-Low-Noise CMOS Image Sensor with High Saturation Capacity
Kazuichiroh Itonaga, Kyohei Mizuta, Toyotaka Kataoka, Harumi Ikeda, Masashii Yanagita, Hiroaki Ishiwata, Yusuke Tanaka, Takashi Wakano, Yoshihisa Matoba, Tetsuya Oishi, Ryou Yamamoto, Shinichi Arakawa, Jun Komachi, Mikio Katsumata, Shinya Watanabe (Sony)
We have developed a flat device structure, which we call “FLAT”, with no isolation grooves/ridges and no Si substrate et... [more]
IEICE-OCS, IEICE-OFT, BCT, IEE-CMN
(Joint) [detail]
2011-11-18
11:50
Shimane Shimane Univ. A study on high-capacity and long-reach 10Gbps TDM-PON with OCDMA technology
Satoshi Yoshima (Mitsubishi Electric), Yusuke Tanaka (Osaka Univ.), Nobuyuki Kataoka (NICT), Junichi Nakagawa (Mitsubishi Electric), Naoya Wada (NICT), Ken-ichi Kitayama (Osaka Univ.)
(Advance abstract in Japanese is available) [more]
 Results 1 - 3 of 3  /   
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