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All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
IST 2021-03-26
12:50
Tokyo Online A Back Illuminated 10μm SPAD Pixel Array Comprising Full Trench Isolation and Cu-Cu Bonding with Over 14% PDE at 940nm
Kyosuke Ito, Yusuke Otake, Yoshiaki Kitano, Akira Matsumoto, Junpei Yamamoto, Takayuki Ogasahara, Hiroki Hiyama, Ryusei Naito, Kohei Takeuchi, Takanori Tada, Kosaku Takabayashi, Hajime Nakayama, Keiji Tatani, Tomoyuki Hirano, Toshifumi Wakano (SONY)
A state of the art Back Illuminated (BI) Single Photon Avalanche Diode (SPAD) array sensor realized via a 90nm CMOS proc... [more] IST2021-14
pp.25-28
IST 2020-03-27
09:00
Tokyo Kikaishinko kaikan
(Postponed)
A 1/2inch 48M All PDAF CMOS Image Sensor Using 0.8μm Quad Bayer Coding 2×2OCL with 1.0lux Minimum AF Illuminance Level
Tatsuya Okawa, Susumu Ooki, Hiroaki Yamajo, Masakazu Kawada, Masayuki Tachi, Kazuhiro Goi, Takatsugu Yamasaki, Hiroki Iwashita, Masahiko Nakamizo, Takayuki Ogasahara, Yoshiaki Kitano, Keiji Tatani (Sony)
Currently, there are two coding trends in mobile image sensors: Quad Bayer coding (QBC) and dual photodiode (DPD). QBC r... [more] IST2020-8
pp.1-5
IST 2018-03-09
11:00
Tokyo NHK Housou-Gijyutu Lab. A Back-Illuminated Global-Shutter CMOS Image Sensor with Pixel-Parallel 14b Subthreshold ADC
Koji Ogawa, Masaki Sakakibara, Shin Sakai, Yasuhisa Tochigi, Katsumi Honda, Hidekazu Kikuchi, Takuya Wada, Yasunobu Kamikubo, Tsukasa Miura, Masahiko Nakamizo (Sony Semiconductor Solutions), Naoki Jyo, Ryo Hayashibara (Sony Semiconductor Manufacturing), Yohei Furukawa, Shinya Miyata (Sony LSI Design), Satoshi Yamamoto, Yoshiyuki Ota, Hirotsugu Takahashi, Tadayuki Taura, Yusuke Oike, Keiji Tatani, Takayuki Ezaki, Teruo Hirayama (Sony Semiconductor Solutions)
 [more] IST2018-14
pp.13-16
IST 2018-03-09
12:00
Tokyo NHK Housou-Gijyutu Lab. [Invited Talk] Pixel/DRAM/logic 3-layer stacked CMOS image sensor technology
Hidenobu Tsugawa, Hiroshi Takahashi, Ryoichi Nakamura, Taku Umebayashi, Tomoharu Ogita, Hitoshi Okano, Kazuya Iwase, Hiroyuki Kawashima, Takatsugu Yamasaki, Daisuke Yoneyama, Jun Hashizume, Tsutomu Nakajima, Kenichi Murata, Yoshikazu Kanaishi, Kenji Ikeda, Keiji Tatani, Hajime Nakayama, Tsutomu Haruta, Tetsuo Nomoto (Sony)
 [more] IST2018-17
pp.25-29
IST 2017-09-25
15:25
Tokyo Kikai-Shinko-Kaikan Bldg. Region Control Oriented Stacked CMOS Image Sensor with Array-Parallel ADC Architecture
Takahito Yamauchi, Tomohiro Takahashi (Sony Semiconductor Solutions), Yuichi Kaji (Sony Electronics Incorporated), Yasunori Tsukuda, Shinichiro Futami (Sony Semiconductor Solutions), Katsuhiko Hanzawa, Ping Wah Wong, Frederick Brady, Phil Holden, Thomas Ayers (Sony Electronics Incorporated), Kyohei Mizuta, Susumu Ohki, Keiji Tatani, Takashi Nagano (Sony Semiconductor Solutions), Hayato Wakabayashi (Sony Electronics Incorporated), Yoshikazu Nitta (ony Semiconductor Solutions)
A 4.1Mpix 280fps stacked CMOS image sensor with array-parallel ADC architecture is developed for region control applicat... [more] IST2017-57
pp.35-38
 Results 1 - 5 of 5  /   
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