ITE Technical Group Submission System
Conference Schedule |
Online Proceedings
[Sign in]
|
|
|
|
|
All Technical Committee Conferences (Searched in: Recent 10 Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IDY, IEICE-EID, SID-JC [detail] |
2024-08-02
15:45 |
Online |
Online |
[Invited Talk]
Investigation of Hybrid Backplane with Highly Reliable IGZO TFTs for mass-production of HMDs
Atsushi Hachiya, Mehadi Aman (Sharp Co.), Hsin-Ying Chiu (Reality Labs), Takushi Shinohara (Sharp Co.), Wan Yu Lin, Hossein Nemati (Reality Labs), Yohei Takeuchi, Kazuatsu Ito, Yuich Saitoh, Hiroaki Furukawa, Yujiro Takeda, Hiroshi Matsukizono (Sharp Co.), Linghui Rao, Jacob Choi (Reality Labs), Yasuhisa Itoh (Sharp Co.), Jim Zhuang (Reality Labs) |
A 2.48-inch with 1,218 ppi, LCD panel for Quest 3 using hybrid backplane technology with CMOS-LTPS and IGZO TFTs has bee... [more] |
IDY2024-30
pp.22-26 |
| IST |
2022-12-12
14:20 |
Shizuoka |
Sanaru Hall |
[Poster Presentation]
Light-induced reliability issue of NMOS using in CMOS image sensor and single-photon avalanche diode
Chun-Hsien Liu, Sheng. Di. Lin (Institute of Electronics, NYCU) |
We present the NMOS reliability issue of increased off-current after white-light illumination. Experimental results sugg... [more] |
IST2022-52
pp.39-40 |
| IDY |
2017-02-24
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Highly Reliable Oxide TFT with Original Solution-Processed Materials
Yukiko Hirano, Minehide Kusayanagi, Sadanori Arae, Ryoichi Saotome, Yuji Sone, Shinji Matsumoto, Yuki Nakamura, Yuichi Ando, Naoyuki Ueda, Katsuyuki Yamada (Ricoh) |
We have developed original oxide materials and inks to make TFT. The original materials were doped-oxide semiconductor, ... [more] |
IDY2017-23
pp.23-27 |
|
|
|
|
|
[Return to Top Page]
[Return to ITE Web Page]
|