ITE Technical Report

Print edition: ISSN 1342-6893      Online edition: ISSN 2424-1970

Volume 43, Number 11

Information Sensing Technologies

Workshop Date : 2019-03-22 / Issue Date : 2019-03-15

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Table of contents

IST2019-12
0.68e rms RandomNoise 121dB DynamicRange Sub pixel architecture CMOS Image Sensor with LED Flicker Mitigation
Mizuno Hiroyuki, Satoko Iida, Yorito Sakano, Tomohiko Asatsuma (SSS), Masashi Takami (SCK), Ippei Yoshiba, Nobuyuki Ohba, Takumi Oka, Kazunori Yamaguchi, Atsushi Suzuki, Keita Suzuki, Manabu Yamada, Yasushi Tateshita, Keiichi Ohno (SSS)
pp. 1 - 6

IST2019-13
Understanding multi-path interference with calibrated and normalized phasor plot in the endoscopic application of TOF image sensors
Keiichiro Kagawa, Ryota Miyagi, Yuta Murakami, Keita Yasutomi, Shoji Kawahito (Shizuoka Univ.)
pp. 7 - 10

IST2019-14
Noise Suppression Effect of Folding-Integration Applied to a column-parallel 3-stage pipeline ADC in a 2.1 μm 33-megapixel CMOS Image sensor
Kohei Tomioka, Kohei Tomioka, Yasue Toshio, Ryohei Funatsu, Tomoki Matsubara (NHK STRL), Tomohiko Kosugi, Sungwook Jun, Takashi Watanabe, Masanori Nagase, Toshiaki Kitajima, Satoshi Aoyama (Brookman Technology), Shoji Kawahito (Shizuoka University)
pp. 11 - 16

IST2019-15
High Performance 2.5um Global Shutter Pixel with New Designed Light-Pipe Structure
Toshifumi Yokoyama, Masafumi Tsutsui, Yoshiaki Nishi, Ikuo Mizuno (TPSCo), Veinger Dmitry, Assaf Lahav (TowerJazz)
pp. 17 - 20

IST2019-16
Back-Illuminated 2.74 μm-Pixel-Pitch Global Shutter CMOS Image Sensor with Charge-Domain Memory Achieving a 10k e- Saturation Signal
Yoshimichi Kumagai, Ryoto Yoshita, Naoyuki Osawa, Harumi Ikeda, Kazuyoshi Yamashita, Takashi Abe, Shigetaka Kudoh (SSS), Junji Yamane, Tooru Idekoba, Shinichiro Nohdo, Yuma Ono, Sachihito Kunitake, Mitsuru Sato, Naoyuki Sato, Takayuki Enomoto (SCK), Keiichi Nakazawa, Hiroyuki Mori, Yasushi Tateshita, Keiichi Ohno (SSS)
pp. 21 - 25

IST2019-17
A 24.3Me- Full Well Capacity and High Near Infrared Sensitivity CMOS Image Sensor with Lateral Overflow Integration Trench Capacitor
Maasa Murata, Rihito Kuroda, Yasuyuki Fujihara, Yusuke Otsuka (Tohoku Univ.), Hiroshi Shibata, Taku Shibaguchi, Yutaka Kamata, Noriyuki Miura, Naoya Kuriyama (LAPIS), Shigetoshi Sugawa (Tohoku Univ.)
pp. 27 - 32

IST2019-18
A 32X32-Pixel 0.9THz Imager with Pixel-Parallel 12b VCO-Based ADC in 0.18μm CMOS
Yuri Kanazawa, Sayuri Yokoyama, Takahiro Ikegami, Prasoon Ambalathankandy, Shota Hiramatsu, Eiichi Sano (Hokkaido Univ.), Yuma Takida, Hiroaki Minamide (RIKEN), Masayuki Ikebe (Hokkaido Univ.)
pp. 33 - 36

IST2019-19
Detection of Partially Polarized Light by CMOS Image Sensor with Polarizers Discretely Placed
Naotsugu Takeda, Makoto Ikeda (Univ. of Tokyo)
pp. 37 - 40

IST2019-20
[Invited Talk] Noise Suppression in Incomplete Transfer Type Pixel
Yoshiyuki Matsunaga, Goji Etoh, Kazuhiro Shimonomura (Rits)
pp. 41 - 47

IST2019-21
A CMOS Proximity Capacitance Image Sensor with 0.1aF Detection Accuracy
Masahiro Yamamoto, Rihito Kuroda, Manabu Suzuki, Tetsuya Goto (Tohoku Univ.), Hiroshi Hamori, Shinichi Murakami, Toshiro Yasuda, Yayoi Yokomichi (OHT Inc.), Shigetoshi Sugawa (Tohoku Univ.)
pp. 49 - 54

IST2019-22
A 400x400-Pixel 6um-Pitch Vertical Avalanche Photodiodes (VAPD) CMOS Image Sensor Based on 150ps-fast Capacitive Relaxation Quenching (RQ) in Geiger Mode for Synthesis of Arbitrary Gain Images
Akito Inoue, Yutaka Hirose, Shinzo Koyama, Toru Okino, Shigeru Saito, Yugo Nose, Motonori Ishii, Seiji Yamahira, Shigetaka Kasuga, Mitsuyoshi Mori, Tatsuya Kabe, Kentaro Nakanishi, Manabu Usuda, Akihiro Odagawa, Tsuyoshi Tanaka (Panasonic)
pp. 55 - 58

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Image Information and Television Engineers (ITE), Japan