| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IST |
2026-03-27
09:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 0.8μm 32Mpixel Always-On CMOS Image Sensor with Windmill-Pattern Edge Extraction and On-Chip DNN
Mamoru Sato, Sachio Akebono, Kazuyoshi Yasuoka, Eriko Kato, Masahiro Tsuruta, Kensuke Ota, Kazuki Haraguchi, Masahiro Watanabe, Genki Fujii, Koichiro Yamanaka, Kazunori Yasuda, Satoshi Minami, Katsuhiko Hanzawa, Kohei Matsuda, Akihiko Kato, Yosuke Ueno (SSS) |
(To be available after the conference date) [more] |
|
| IST |
2026-03-27
10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Back-illuminated 10 μm-pitch SPAD Depth Sensor with 42.5% PDE at 940 nm using an Optimized Doping Design
Shohei Shimada, Yusuke Otake, Junki Suzuki, Aoi Magori, Kenji Kurata, Tomonori Matsui, Ryoya Tsuchida (Sony Semiconductor Solutions), Mutsumi Okazaki (Sony), Kaito Yokochi, Toshihito Iwase, Hiroaki Takase, Fumihiko Koga, Jun Ogi (Sony Semiconductor Solutions), Hidenori Maeda, Koji Moriyama, Hideyuki Honda (Sony Semiconductor Manufacturing), Kaoru Fujisawa, Takahiro Miura, Hiroaki Kouketsu, Toshifumi Wakano (Sony Semiconductor Solutions) |
[more] |
|
| IST |
2026-03-27
11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
10 µm Pitch Ge-on-Si SPAD Pixel Array with PDE of 33.8% at 1300 nm and 23.3% at 1550 nm under Room Temperature Environment
Satoru Yoshida, Shohei Shimada, Atsushi Matsuzaki, Sylvia Loo Mei Lin, Yusuke Otake, Tetsuji Nagayama, Soichi Ochiai, Takashi Tange, Ken Sasaki, Atsuhito Yasui, Kaito Yokochi, Hiroaki Takase, Katsuaki Sasaki, Masaru Miyashita, Tetsu Ono (Sony Semiconductor Solutions), Kazuma Takahashi, Hirotaka Tanaka, Ryu Sasaki, So Mitoma (Sony Semiconductor Manufacturing), Toshifumi Wakano (Sony Semiconductor Solutions) |
[more] |
|
| IST |
2026-03-27
13:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Silicon-on-Insulator Pixel FinFET Technology for a High Conversion Gain and Low Dark Noise 2-Layer Transistor Pixel Stacked CIS
Ryohei Takayanagi, Takashi Kamo, Ryosuke Yamachi, Mayu Sakurai, Hidetoshi Oishi, Takuya Iriguchi, Hiroshi Takahashi, Taikei Enomoto, Yuki Kageyama, Yusuke Tanaka, Yoshiaki Kikuchi, Junpei Yamamoto, hideomi kumano, Shinichi Yoshida, Yoshiaki Kitano, Kazunobu Ohta, Tomoyuki Hirano (Sony Semiconductor Solutions) |
(To be available after the conference date) [more] |
|
| IST |
2026-03-27
14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.1 μm Single-Exposure 129 dB Dynamic Range CMOS Image Sensor with Triple Readout Technique
Ryosuke Nakamura, Takaya Yamanaka, Shunsuke Kasashima, Chie Tokumitsu, Masatoshi Kitajima, Rikuya Matano, Takeshi Ishizaki, Hiroaki Iga, Makoto Aoki (SSS), Shohei Nabeyoshi, Masashi Takami, Shuto Kuwahara (SCK), Yorito Sakano, Yusuke Oike (SSS) |
[more] |
|
| IST |
2026-03-27
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 25M points/s Back-Illuminated Stacked SPAD Direct Time-of-Flight Depth Sensor with Equivalent Time Sampling and Pixel-Level Threshold Control for Automotive LiDAR
Katsuhiko Hanzawa, Tatsuya Yui, Masahiro Hosoya, Yuqing Liu, Tadashi Yasufuku, Yoshinori Tanaka, Yoshiaki Tashiro, Albert Tumewu (SSS), Masataka Yamane, Masatoshi Shibata, Toshiki Sakada (SCK), Kazuhisa Akatsuka, Yudai Matsushita (SSS), Koki Yamada, Kouji Mori (SCK), Takahiro Toyoshima, Yorito Sakano, Oichi Kumagai, Kenichi Tsunoji, Masayuki Takahashi (SSS) |
(To be available after the conference date) [more] |
|
| IST |
2025-11-21
13:30 |
Tokyo |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
A Novel 1/1.3-inch 50 Megapixel three-wafer-stacked CMOS Image Sensor with DNN Circuit for Edge Processing
Ryoichi Nakamura, Hidenobu Tsugawa, Wataru Otsuka, Kan Shimizu, Yoshihisa Kagawa, Kenta Ono, Yosuke Horie (Sony Semiconductor Solutions) |
This study reports the first ever 3-wafer-stacked CMOS image sensor comprising an artificial intelligence (AI) chip with... [more] |
IST2025-46
pp.1-4 |
| IST |
2025-09-18
11:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A 2.1μm High Dynamic Range CMOS Image Sensor with Sub-pixel and Lateral Overflow Integration Capacitor Architecture
Shunta Noguchi, Satoko Iida, Naoya Sato, Shinichiro Izawa, Takayuki Yamanaka, Yorito Sakano, Yusuke Oike (Sony) |
This is a report on an Automotive CMOS image sensor using a pixel architecture of 2.1μm Sub-pixel and Lateral Overflow I... [more] |
IST2025-38
pp.9-12 |
| IST |
2025-09-18
15:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Pixel Design of Gain-Boosted Event-Based Vision Sensor to Control Event Noise and Latency at Low Illuminance
Masahiro Tsukamoto, Yusuke Sato, Futa Mochizuki, Hirotsugu Takahashi, Kazuyoshi Yamashita, Atsumi Niwa, Tetsuji Yamaguchi, Hayato Wakabayashi, Yusuke Oike (Sony Semiconductor Solutions) |
Event-based vision sensor (EVS) generally faces issues with false detection, commonly known as the background rate (BGR)... [more] |
IST2025-43
pp.29-32 |
| IDY, IEICE-EID, SID-JC [detail] |
2025-08-01
13:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. +Zoom
(Primary: On-site, Secondary: Online) |
[Invited Talk]
0.26-inch LED Microdisplay Using Pixel Level Cu-Cu Connections of Transferred GaN/Si and CMOS Backplane Wafer
Haruki Tsuchiya, Toshihiro Miura, Ryosuke Matsumoto, Mikio Takiguchi, Toru Sasaki, Michihiro Kanno, Koichi Nagasawa, Hayato Iwamoto (SSS) |
[more] |
IDY2025-33
pp.1-4 |
| IST |
2025-03-21
10:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Novel 1/1.3-inch 50 Megapixel Three-wafer-stacked CMOS Image Sensor with DNN Circuit for Edge Processing
Yukihiro Tatsumi, Ryoichi Nakamura, Hidenobu Tsugawa, Kan Shimizu, Yoshihisa Kagawa, Kenta Ono, Yousuke Horie, Wataru Otsuka, Hayato Iwamoto (Sony Semiconductor Solutions) |
[more] |
IST2025-9
pp.1-4 |
| IST |
2025-03-21
13:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A Color Image Sensor Using 1.0-μm Organic Photoconductive Film Pixels Stacked on 4.0-μm Si Pixels for Near-Infrared Time-of-Flight Depth Sensing
Nobuhiro Kawai, Tomohiro Ohkubo, Kimiyasu Shiina, Kei Fukuhara, Ryotaro Takaguchi, Tetsuro Takada (SSS), Yoshito Nagashima, Takahito Niwa (SCK), Masahiro Joei, Kensaku Maeda, Tomoyuki Hirano, Atsushi Suzuki, Hideaki Togashi, Tetsuji Yamaguchi, Yusuke Oike (SSS) |
[more] |
IST2025-14
pp.18-22 |
| IST |
2025-03-21
14:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 2.1-ns Dead Time 5-μm Single Photon Avalanche Diode with 2-layer Transistor Pixel Technology
Shota Kitamura, Jun Ogi, Fumitaka Sugaya, Junki Suzuki, Aoi Magori, Tomonori Matsui, Kei Sumita, Yuki Ushiku (Sony Semiconductor Solutions), Koji Moriyama, Kenji Toshima (Sony Semiconductor Manufacturing), Tomohiro Namise, Hideki Ozawa, Yasunori Tsukuda, Yusuke Otake, Hiroki Hiyama, Shizunori Matsumoto, Atsushi Suzuki, Fumihiko Koga (Sony Semiconductor Solutions) |
This study reports a 5-$mu$m-pitch single photon avalanche diode (SPAD) with 2-layer transistor pixel technology. The de... [more] |
IST2025-16
pp.27-31 |
| IST |
2025-03-21
14:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Low Dark Noise and 8.5k e- Full Well Capacity in a 2-Layer Transistor Stacked 0.8μm Dual Pixel CIS with Intermediate Poly-Si Wiring
Yosuke Satake, Shinya Sato, Masayuki Takase, Mizuki Hoyano, Shuhei Kasukawa, Yusuke Tanaka, Yoshiaki Kitano, Manabu Tomita, Junpei Yamamoto, Kai Tokuhiro, Yoshiaki Kikuchi, Hirano Tomoyuki, Yoshiki Nishida (SSS) |
[more] |
IST2025-17
pp.32-36 |
| IST |
2025-03-21
15:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
A 25.2Mpixel 120frames/s Full-Frame Global-Shutter CMOS Image Sensor with Pixel-Parallel ADC
Tohru Takeda, Toshiki Kainuma, Ryo Wakamatsu, Kimitaka Wada, Shota Ueyama, Hiroki Suto, Tsukasa Miura, Koushi Uemura, Masao Kimura, Masaki Sakakibara, Yusuke Oike (SSS) |
We report a full-frame global shutter CMOS image sensor using pixel-parallel ADCs with a high-resolution of 25.2M pixels... [more] |
IST2025-20
pp.48-52 |
| IST |
2024-09-25
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
[Tutorial Lecture]
the shrinkage and high functionality of the pixels
Akiko Honjo (SSS) |
[more] |
IST2024-46
pp.11-17 |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2024-08-07
11:10 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
[Invited Lecture]
High resolution and compact integrated FMCW-LiDAR chip with 128 channels of Slow Light Grating Antennas
Yuya Maeda, Yoshiki Ebiko, Haruhiko Terada, Ryo Tetsuya, Shunji Maeda, Yotaro Yasu (Sony Semiconductor Solutions), Takemasa Tamanuki, Mikiya Kamata, Keisuke Hirotani, Saneyuki Suyama, Kohei Yamamoto, Shota Nawa, Riku Kubota, Toshihiko Baba (YNU) |
[more] |
|
| IST |
2024-03-27
10:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
216 fps 672 × 512 pixel 3 μm Indirect Time-of-Flight Image Sensor with 1-Frame Depth Acquisition for Motion Artifact Suppression
Chihiro Okada, Sozo Yokogawa, Yuhi Yorikado, Katsumi Honda, Naoki Okuno, Ryohei Ikeno, Makoto Yamakoshi, Hiroshi Ito (SSS), Shohei Yoshitsune, Masatsugu Desaki, Shota Hida (SCK), Atsushi Nose, Hayato Wakabayashi, Fumihiko Koga (SSS) |
[more] |
IST2024-11
pp.1-3 |
| IST |
2024-03-27
12:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
Intelligent Vision Sensor and Edge Computing Envisage the Future
Ryohei Kawasaki, Ryoji Eki, Eita Yanagisawa (SSS) |
[more] |
IST2024-15
pp.16-19 |
| IST |
2024-03-27
15:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online) |
An 0.08 e*pJ/step gain-adaptive single-slope ADC with enhanced HDR function for high-quality imagers
Luong Hung, Koji Matsuura, Hiroki Suto, Kazutoshi Kodama, Yosuke Tanaka, Toshiaki Ono, Junichiro Fujimagari, Miho Akahide, Yoshiaki Inada (Sony Semiconductor Solutions) |
This paper, which was reported at IEEE Symposium on VLSI circuit 2023, presents a high-speed, power-efficient single-slo... [more] |
IST2024-20
pp.39-41 |
|