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| Chair |
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Hiroya Ikeda (Shizuoka Univ.) |
| Vice Chair |
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Takahiro Mori (AIST) |
| Secretary |
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Hiroshi Okada (Toyohashi Univ. of Tech.), Taizo Sadoh (Kyushu Univ.) |
| Assistant |
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Junichi Hattori (AIST), Katsunori Makihara (Nagoya Univ.) |
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| Chair |
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Hayato Wakabayashi (Sony Semiconductor Solutions) |
| Vice Chair |
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Kenichi Okada (Science Tokyo) |
| Secretary |
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Takeshi Kuboki (Hiroshima Univ.), Kyoya Takano (Tokyo Univ. of Sci.) |
| Assistant |
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Atsutake Kosuge (Utokyo), Masanobu Tsuji (ROHM) |
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| Conference Date |
Tue, Aug 4, 2026 10:00 - 16:50
Wed, Aug 5, 2026 09:00 - 17:00
Thu, Aug 6, 2026 10:00 - 12:00 |
| Topics |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
| Conference Place |
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| Transportation Guide |
https://www.math.sci.hokudai.ac.jp/sympo/hokudai_j.html |
| Sponsors |
This conference is co-sponsored by IEEE SSCS Japan Chapter, IEEE SSCS Kansai Chapter and The Japan Society of Applied Physics.
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| Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on IST. |
| Due for Registration |
Please proceed the payment of registration fee by 3 days before the workshop date. The meeting URL will be announced from one of the secretaries of the committee via e-mail, just before the workshop date. |
Tue, Aug 4 AM
10:00 - 12:00 |
(1)
IEICE-SDM |
10:00-10:45 |
[Invited Talk]
Further Scaling of the Capacitance Equivalent Thickness (CET) In High-k/Metal Gate Stacks Toward the 2nm Technology Node and Beyond: Prospects and Challenges |
Yukinori Morita, Takamasa Kawanago, Takefumi Kamioka (AIST/LSTC), Yuichiro Mitani (Tokyo City Univ./LSTC), Toshihide Nabatame, Takashi Onaya, Naoki Fukata, Wipakorn Jevasuwan, Kazuhito Tsukagoshi (NIMS/LSTC), Takuya Hoshii (Science Tokyo/LSTC), Kasidit Toprasertpong, Atsushi Tamura, Koji Kita (The Univ. Tokyo/LSTC), Naoya Okada, Kenzo Manabe, Wataru Mizubayashi, Hiroyuki Ota, Takashi Matsukawa, Shinji Migita (AIST/LSTC) |
(2)
IEICE-SDM |
10:45-11:10 |
Gate-length dependence of subthreshold slope in cryogenic operation of MOSFETs |
Takumi Katori (AIST/TDU), Hidehiro Asai, Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Yuika Kobayashi, Takashi Nakayama (AIST), Satoshi Moriyama (TDU), Takahiro Mori (AIST) |
(3)
IEICE-ICD |
11:10-11:35 |
Single-Input Six-Output Isolated DC-DC Converter ICs for Gate Drivers in Three-Phase Inverters |
Yichen Zhang, Yaogan Liang, Michihiro Ide, Makoto Takamiya (UTokyo) |
(4)
IEICE-ICD |
11:35-12:00 |
Design of a Secure dToF LiDAR Architecture for Sensor-Level Attack Resilience |
Risa Nonaka, Ryoya Matsuno, Shota Nagai, Satomi Miyagi, Masayuki Murakami, Kentaro Yoshioka (Keio Univ.) |
Tue, Aug 4 PM
13:00 - 14:50 |
(5)
IEICE-SDM |
13:00-13:45 |
[Memorial Lecture]
Atomic layer deposited polycrystalline Ga-doped In2O3 nanosheet for integrated device applications |
Takanori Takahashi (NAIST), Takuya Hoshii (Science Tokyo), Yuki Tsuruma, Misa Sunagawa, Shigekazu Tomai (Idemitsu Kosan), Jongho Park, Hiroki Tamamoto, Kuniyuki Kakushima (Science Tokyo), Yukiharu Uraoka (NAIST) |
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13:45-13:55 |
Award ceremony ( 10 min. ) |
(6)
IST |
13:55-14:40 |
[Invited Talk]
Research and Development of Medical AI for Rheumatoid Arthritis, a Disease Affecting a Large Number of Patients |
Ou Yafei (RIKEN), Wang Haolin, Kamishima Tamotsu, Ikebe Masayuki (Hokkaido Univ.), Takamaeda Shinya (RIKEN) |
| |
14:40-14:50 |
Break ( 10 min. ) |
Tue, Aug 4 PM
14:50 - 16:50 |
(7)
IST |
14:50-15:15 |
Study of an Event-Trigger Circuit Using the Photovoltaic Effect of an CMOS Image Sensor |
Chihiro Fujita, Furukata Anji, Ami Tanaka (Ritsumeikan), Daisuke Horii, Ryotaro Hotta, Tetsuro Okura (Renesas), Shunsuke Okura (Ritsumeikan) |
(8)
IST |
15:15-15:40 |
A Column-Parallel PGA with Dynamic Gain Selection Mitigating SNR Dip |
Ren Kinoshita, Toshinori Otaka, Shunichi Sato, Takayuki Hamamoto (TUS) |
(9)
IEICE-ICD |
15:40-16:05 |
Fault Injection into KV Cache of an FPGA-based Transformer and Its Evaluation |
Ryo Kumagai, Shu Takemoto, Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.) |
| (10) |
16:05-16:50 |
ICD招待講演（今後更新予定） |
Wed, Aug 5 AM
09:00 - 12:10 |
| (11) |
09:00-09:45 |
ICD招待講演（今後更新予定） |
| (12) |
09:45-10:30 |
ICD招待講演（今後更新予定） |
| |
10:30-10:40 |
Break ( 10 min. ) |
(13)
IEICE-SDM |
10:40-11:25 |
[Invited Talk]
Multi-stacked Channels and Doped Source/Drains Toward TMDC CFETs |
Shinichi Tanabe (Tokyo Electron Ltd.) |
(14)
IEICE-SDM |
11:25-12:10 |
[Invited Talk]
A 2.1-μm Pixel-Pitch CMOS Image Sensor with 65% MTF/35% QE IR Global Shutter and RGB Rolling Shutter Sequential Operation for In-cabin Applications |
Mizuha Hiroki, Tatsuya Takeuchi, Yuta Nakamoto, Yuki Yoshimura, Hiroki Hagiwara, Ryotaro Takata, Kaihei Hotta (SSS), Yuji Nishimura, Shingo Yamaguchi, Ayumi Takayama (SCK), Ryosuke Nakamura, Takahiro Toyoshima, Yorito Sakano, Yusuke Oike (SSS) |
Wed, Aug 5 PM
13:10 - 17:00 |
(15)
IEICE-SDM |
13:10-13:55 |
[Invited Talk]
3D Orthogonal Die Stacking Technology for DRAM-on-GPU Integration Using Contactless Die-to-Die Interface |
Yuki Mitarai, Hung-Chih Huang, Mototsugu Hamada, Atsutake Kosuge (UTokyo) |
(16)
IST |
13:55-14:40 |
[Invited Talk]
Analysis and Verification Methodologies and AI-Based Design Automation for Semiconductor Systems in the GAA Era |
Takehiko Nakao (Cadence Japan) |
| |
14:40-15:00 |
Break ( 20 min. ) |
| (17) |
15:00-17:00 |
Pannel Discussion |
Thu, Aug 6 AM
10:00 - 12:00 |
(18)
IEICE-SDM |
10:00-10:45 |
[Invited Talk]
A Multi-Stacked Cell Array Architecture with Wafer-to-Wafer Cu Direct Bonding for Ultra-High-Density 3D Flash Memory beyond 1,000 Word Lines |
Mitsuhiko Noda, Susumu Hashimoto, Ryuta Mizumoto, Mamoru Watanabe, Genki Sawada, Kanta Kawasaki, Masahisa Sonoda, Eiji Kamiya, Tetsu Morooka, Keisuke Nakatsuka, Hiroshi Maejima, Shigeki Kobayashi, Shinji Suzuki (Kioxia), Yukihiro Sakotsubo, Kohei Osawa, Shinya Sato, Teiji Shibasaki, Masahiro Yaegashi, Ryoichi Honma (Sandisk), Masayoshi Tagami, Katsuyuki Sekine (Kioxia) |
(19)
IEICE-SDM |
10:45-11:10 |
Confirmation of Short-Term Synaptic Plasticity Operation Using a Dual-Gate PN-Body Tied SOI-FET |
Yukihiko Yamazaki (Kanazawa Inst. of Tech.), Haruki Yonezaki (Kanazawa Inst. of Tech./KIOXIA Corp.), Takayuki Mori, Jiro Ida (Kanazawa Inst. of Tech.) |
(20)
IST |
11:10-11:35 |
Hardware Architecture Study for Gradation-Texture Adaptive Local Tone Mapping |
Prasoon Ambalathankandy, Ryosei Watanabe, Masayuki Ikebe (Hokkaido Univ.) |
(21)
IST |
11:35-12:00 |
A Temperature-Calibration-Free CMOS Temperature Sensor with Threshold-Voltage Compensation |
Natsuki Tanaka, Yoshihiro Komatsu, Kodai Mabe, Hayaki Kurashima, Masayuki Ikebe (HU) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 40 minutes for presentation and 5 minutes for discussion. |
| Memorial Lecture | Each speech will have 40 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| IST |
Technical Group on Information Sensing Technologies (IST) [Latest Schedule]
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| Contact Address |
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| IEICE-SDM |
Technical Committee on Silicon Device and Materials (IEICE-SDM) [Latest Schedule]
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| Contact Address |
※各研究会幹事もしくは担当者の連絡先を記載してください。 |
| IEICE-ICD |
Technical Committee on Integrated Circuits and Devices (IEICE-ICD) [Latest Schedule]
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| Contact Address |
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Last modified: 2026-06-18 10:31:50
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