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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-01 10:00 |
Osaka |
Central Electric Club |
A fast-start up and fully-integrated 32-MHz clock generator for intermittent VLSI systems Hiroki Asano, Tetsuya Hirose, Taro Miyoshi, Keishi Tsubaki, Toshihiro Ozaki, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.) |
This paper proposes a fully integrated 32-MHz relaxation oscillator (ROSC)
capable of fast start-up time operation f... [more] |
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IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03 14:15 |
Osaka |
Central Electric Club |
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs Yasuhiro Ogasahara, Hanpei Koike (AIST) |
This paper discusses impacts of flexible Vth control, low process variability, and steep SS with small on-current of new... [more] |
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IEICE-ICD, IEICE-SDM, IST [detail] |
2016-08-03 15:05 |
Osaka |
Central Electric Club |
Increased Drain-Induced Variability and Within-Device Variability in Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm Tomoko Mizutani, Kiyoshi Takeuchi, Ryota Suzuki, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo) |
The effects of drain voltage in threshold voltage variability in extremely narrow silicon nanowire (NW) channel FETs are... [more] |
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IST |
2012-05-28 13:00 |
Tokyo |
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[Poster Presentation]
Mismatch Analysis of a Distributed Ramp Signal Generator for In-Pixel Analog to Digital Conversion Kaita Imai, Keita Yasutomi, Keiichiro Kagawa, Kawahito Shoji (Shizuoka Univ.) |
To implement ADC in every pixel is effective for high-speed high-resolution CMOS image sensors. Single slope ADC is a go... [more] |
IST2012-19 pp.13-14 |
IST, IEICE-ICD |
2011-07-22 09:25 |
Hiroshima |
Hiroshima Institute of Technology |
An All-Digital On-Chip PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator Tetsuya Iizuka, Kunihiro Asada (Univ. of Tokyo) |
This paper proposes an all-digital process variability monitor based on a shared structure of a buffer ring and a ring o... [more] |
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IST, IEICE-ICD |
2010-07-22 10:45 |
Osaka |
Josho Gakuen Osaka Center |
Buffer-Ring-Based All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Tetsuya Iizuka, Toru Nakura, Kunihiro Asada (Univ. of Tokyo) |
In this paper, we propose an all-digital process variability monitor which utilizes a simple buffer ring with a pulse co... [more] |
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