| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| IEICE-ICD, IEICE-SDM, IST [detail] |
2026-08-06
10:45 |
Hokkaido |
Hokkaido Univ, Pharmaceutical Sciences, Lecture Room 2
(Primary: On-site, Secondary: Online) |
Confirmation of Short-Term Synaptic Plasticity Operation Using a Dual-Gate PN-Body Tied SOI-FET
Yukihiko Yamazaki (Kanazawa Inst. of Tech.), Haruki Yonezaki (Kanazawa Inst. of Tech./KIOXIA Corp.), Takayuki Mori, Jiro Ida (Kanazawa Inst. of Tech.) |
In this study, we demonstrated short-term synaptic plasticity (STP) operation using a Dual-Gate PN-Body Tied SOI-FET for... [more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2025-08-06
13:00 |
Hokkaido |
Hokkaido Univ. Prmaceutical of Science
(Primary: On-site, Secondary: Online) |
Neuron Operation with PN-Body Tied SOI-FET
-- Investigation of High-Input Impedance --
Yukihiko Yamazaki, Takayuki Mori (Kanazawa Inst. of Tech.), Haruki Yonezaki (KIOXIA Corp./Kanazawa Inst. of Tech.), Jiro Ida (Kanazawa Inst. of Tech.) |
[more] |
|
| IST, ME, IEICE-IE, IEICE-BioX, IEICE-SIP, IEICE-MI [detail] |
2025-06-05
10:50 |
Ishikawa |
|
Investigation of A Personal Authentication Method Using Insole-Type Gait Sensors Based on Deep Learning
Etsushi Kumamoto, Kyosuke Fukamachi, Susumu Sato, Takashi Kawanami (KIT) |
Gait is a subconscious and difficult-to-forge behavior, making it suitable for biometric authentication. However, many e... [more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2024-08-06
11:25 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Reducing short-circuit current of CMOS Inverter circuits with “PN-Body Tied SOI-FET”
Kazuki Nakahashi, Takayuki Mori, Jiro Ida (Kanazawa Institute of Technology) |
In this study, we report the results of Short-Circuit current measurements in a CMOS inverter circuit using a "PN-Body T... [more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2023-08-01
16:35 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Analysis of back bias effects and history phenomena in cryo 200nm SOIMOSFETs
Ryusei Ri, Takayuki Mori (KIT), Hiroshi Oka, Takahiro Mori (AIST), Jiro Ida (KIT) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
13:15 |
Online |
On-line |
[Invited Talk]
Research on Steep Slope "PN-Body Tied SOI-FET" for Ultra Low Power LSI
Jiro Ida, Takayuki Mori (Kanazawa IT) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2022-08-08
14:00 |
Online |
On-line |
Evaluation of Steep Subthreshold Slope Device "Dual-gate PN-body Tied SOI-FET" for Ultra-low Voltage Operation
Haruki Yonezaki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC) |
[more] |
|
| BCT, IEICE-CS, IPSJ-AVM, IEICE-IE [detail] |
2020-11-26
13:20 |
Online |
Online |
A Study on privacy protection in virtual IoT platforms
Kazuki Shigemori, Hiroaki Mukai, Tetsuya Yokotani (KIT) |
[more] |
|
| BCT, IEICE-CS, IPSJ-AVM, IEICE-IE [detail] |
2020-11-26
13:45 |
Online |
Online |
Concept for and Development of the Home Gateway Applied to Internet of Things
Eisei Yoshida, Tetsuya Yokotani, Hiroaki Mukai (KIT) |
[more] |
|
| IEICE-ICD, IEICE-SDM, IST [detail] |
2020-08-07
11:00 |
Online |
Online |
CMOS Inverter Transfer Characteristics on Steep SS “PN-Body Tied SOI-FET”
Shota Ishiguro, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-09
14:10 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
Effect of Vsub and Positive Charge in Buried Oxide on Super Steep SS “PN Body-Tied SOI-FET”
Wataru Yabuki, Jiro Ida, Takayuki Mori (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) |
[more] |
|
| IEICE-SDM, IEICE-ICD, IST [detail] |
2019-08-09
14:35 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
Ultra Low power rectenna with super SS "PN-Body Tied SOI-FET"
Takuya Yamada, Jiro Ida, Takayuki Mori, Nobuhiko Yasumaru, Kenji Itoh (KIT), Koichiro Ishibashi (UEC) |
[more] |
|
| IST, ME, IEICE-BioX [detail] |
2019-06-07
15:15 |
Ishikawa |
|
Proposal of auditory stimulus reconstruction system using magnetoencephalography (MEG)
Masato Yamashita, Minoru Nakazawa (KIT) |
[more] |
IST2019-33 ME2019-81
pp.67-72 |
| IEICE-CS, IEICE-IE, IPSJ-AVM, BCT [detail] |
2018-11-30
11:10 |
Tokushima |
Tokushima University |
Introduction of Fed4IoT project toward federating IoT and cloud infrastructures
-- Concept and future plan --
Kenji Kanai, Hidenori Nakazato, Hidehiro Kanemitsu (Waseda Univ), Hajime Tazaki (IIJ), Kenichi Nakamura, Mitsuru Uesugi (Panasonic), Tetsuya Yokotani, Hiroaki Mukai (KIT), Jiro Katto (Waseda Univ) |
[more] |
|
| IST, IEICE-ICD, IEICE-SDM |
2018-08-07
14:25 |
Hokkaido |
Hokkaido University M Bldg. M151 |
Experiment of Ultralow Voltage Rectification by Super Steep SS "PN-Body Tied SOI-FET"
Shun Momose, Jiro Ida, Takuya Yamada, Takayuki Mori, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) |
[more] |
|
| IEICE-EID, IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] |
2018-01-26
09:30 |
Shizuoka |
Shizuoka Univ., Hamamatsu |
Evaluation of photoluminescence and photoacoustic characteristics in Bi-activated oxide phosphors
Kosuke Sakuma, Yuta Shimooki, Yuki Yoshimoto, Shota Yokka, Haruki Fukada, Athushi A Yamaguchi (Kanazawa Inst. of Tech.) |
[more] |
|
| IEICE-EID, IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] |
2018-01-26
09:40 |
Shizuoka |
Shizuoka Univ., Hamamatsu |
Luminescent properties in ZnO thin films prepared by mist-CVD method
Katsuya Nakada, Takeshi Kanno, Yoshiki Saito, Shogo Saeki, Satoshi Yamaji, Haruki Fukada, Atsushi Yamaguchi (KIT) |
[more] |
|
| IEICE-CS, IEICE-IE, IPSJ-AVM, BCT [detail] |
2017-11-30
09:30 |
Aichi |
|
Interim report: Requirements on the IoT communication platform and standardization trends
Tetsuya Yokotani (KIT) |
[more] |
|
| IEICE-CS, IEICE-IE, IPSJ-AVM, BCT [detail] |
2017-11-30
09:55 |
Aichi |
|
Analysis of traffic on surveillance camera system and hardware emulation
Yoshki Kuwabara, Kosuke Tsuchiya, Koji Omote, Hiroaki Mukai, Tetsuya Yokotani (KIT) |
[more] |
|
| HI, VRPSY |
2017-11-24
15:10 |
Ishikawa |
Kanazawa Institute of Technology |
[Invited Talk]
Human mechanisms of spatial perception
Masao Ohmi (KIT) |
[more] |
HI2017-70
|